Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources
Career Center
Tech News
Resource Center
Press Room
Advertising
Librarian Resources
IEEE.org
Help
About Us
Career Center
Cart
Create Account
Sign In
Toggle navigation
My Subscriptions
Browse Content
Resources
All
Home
Proceedings
DDECS
DDECS 2009
Generate Citations
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Apr. 15 2009 to Apr. 17 2009
Liberec, Czech Republic
ISBN: 978-1-4244-3341-4
Table of Contents
Papers
[Copyright notice]
Freely available from IEEE.
pp. ii
Papers
Symposium Committees
Freely available from IEEE.
pp. iv
Papers
Table of contents
Freely available from IEEE.
pp. v-ix
Papers
Foreword to the 12th IEEE DDECS symposium
Freely available from IEEE.
pp. iii
Papers
Design tools and circuit solutions for degradation-resilient analog circuits in nanometer CMOS
Full-text access may be available. Sign in or learn about subscription options.
pp. 1
by
Georges Gielen
Papers
Cognitive self-adaptive computing and communication systems: Test, control and adaptation
Full-text access may be available. Sign in or learn about subscription options.
pp. 2
by
Abhijit Chatterjee
Papers
Challenges for test and design for test
Full-text access may be available. Sign in or learn about subscription options.
pp. 3
by
Anton Chichkov
Papers
An SOC platform for ADC test and measurement
Full-text access may be available. Sign in or learn about subscription options.
pp. 4-7
by
Brendan Mullane
,
Vincent O'Brien
,
Ciaran MacNamee
,
Thomas Fleischmann
Papers
A scheme of logic self repair including local interconnects
Full-text access may be available. Sign in or learn about subscription options.
pp. 8-11
by
T. Koal
,
D. Scheit
,
H. T. Vierhaus
Papers
Investigating the linearity of MOSFET-only switched-capacitor ?S modulators under low-voltage condition
Full-text access may be available. Sign in or learn about subscription options.
pp. 12-15
by
Farhad Alibeygi Parsan
,
Ahmad Ayatollahi
,
Adib Abrishamifar
Architecture model for approximate palindrome detection
Full-text access may be available. Sign in or learn about subscription options.
pp. 90-95
by
Tomas Martinek
,
Jan Vozenilek
,
Matej Lexa
Papers
Comparison of different test strategies on a mixed-signal circuit
Full-text access may be available. Sign in or learn about subscription options.
pp. 16-19
by
Juraj Brenkus
,
Viera Stopjakova
,
Ronny Vanhooren
,
Anton Chichkov
Packet header analysis and field extraction for multigigabit networks
Full-text access may be available. Sign in or learn about subscription options.
pp. 96-101
by
Petr Kobiersky
,
Jan Korenek
,
Libor Polcak
Papers
Case Study : A class E power amplifier for ISO-14443A
Full-text access may be available. Sign in or learn about subscription options.
pp. 20-23
by
Elke De Mulder
,
Wim Aerts
,
Bart Preneel
,
Ingrid Verbauwhede
,
Guy Vandenbosch
Papers
Fast congestion-aware timing-driven placement for island FPGA
Full-text access may be available. Sign in or learn about subscription options.
pp. 24-27
by
Jinpeng Zhao
,
Qiang Zhou
,
Yici Cai
Papers
Analysis and optimization of ring oscillator using sub-feedback scheme
Full-text access may be available. Sign in or learn about subscription options.
pp. 28-29
by
Hong-Yi Huang
,
Fu-Chien Tsai
Papers
Improve clock gating through power-optimal enable function selection
Full-text access may be available. Sign in or learn about subscription options.
pp. 30-33
by
Juanjuan Chen
,
Xing Wei
,
Yunjian Jiang
,
Qiang Zhou
Papers
An utilisation of Boolean differential calculus in variables partition calculation for decomposition of logic functions
Full-text access may be available. Sign in or learn about subscription options.
pp. 34-37
by
Stefan Kolodzinski
,
Edward Hrynkiewicz
Papers
A fast untestability proof for SAT-based ATPG
Full-text access may be available. Sign in or learn about subscription options.
pp. 38-43
by
Daniel Tille
,
Rolf Drechsler
Papers
The impact of EFSM composition on functional ATPG
Full-text access may be available. Sign in or learn about subscription options.
pp. 44-49
by
Davide Bresolin
,
Giuseppe Di Guglielmo
,
Franco Fummi
,
Graziano Pravadelli
,
Tiziano Villa
Papers
An efficient fault simulation technique for transition faults in non-scan sequential circuits
Full-text access may be available. Sign in or learn about subscription options.
pp. 50-55
by
A. Bosio
,
P. Girard
,
S. Pravossoudovich
,
P. Bernardi
,
M. Sonza Reorda
Papers
Self-timed full adder designs based on hybrid input encoding
Full-text access may be available. Sign in or learn about subscription options.
pp. 56-61
by
P. Balasubramanian
,
D.A. Edwards
,
C. Brej
Papers
Optimization concepts for self-healing asynchronous circuits
Full-text access may be available. Sign in or learn about subscription options.
pp. 62-67
by
Thomas Panhofer
,
Werner Friesenbichler
,
Martin Delvai
Papers
Asynchronous two-level logic of reduced cost
Full-text access may be available. Sign in or learn about subscription options.
pp. 68-73
by
Igor Lemberski
,
Petr Fiser
Papers
Low-voltage low-power double bulk mixer for direct conversion receiver in 65nm CMOS
Full-text access may be available. Sign in or learn about subscription options.
pp. 74-77
by
Kurt Schweiger
,
Heimo Uhrmann
,
Horst Zimmermann
Papers
Low voltage LNA implementations in 90 nm CMOS technology for multistandard GNSS
Full-text access may be available. Sign in or learn about subscription options.
pp. 78-83
by
Jacek Gradzki
,
Tomasz Borejko
,
Witold A. Pleskacz
Papers
BIST assisted wideband digital compensation for MB-UWB transmitters
Full-text access may be available. Sign in or learn about subscription options.
pp. 84-89
by
Shyam Kumar Devarakond
,
Shreyas Sen
,
Abhijit Chatterjee
Papers
A symbolic RTL synthesis for LUT-based FPGAs
Full-text access may be available. Sign in or learn about subscription options.
pp. 102-107
by
Stanislaw Deniziak
,
Mariusz Wisniewski
Papers
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Full-text access may be available. Sign in or learn about subscription options.
pp. 108-113
by
Yiorgos Sfikas
,
Yiorgos Tsiatouhas
Papers
Using 3-valued memory representation for state space reduction in embedded assembly code model checking
Full-text access may be available. Sign in or learn about subscription options.
pp. 114-119
by
Thomas Reinbacher
,
Martin Horauer
,
Bastian Schlich
Papers
An on-line testing scheme for repairing purposes in Flash memories
Full-text access may be available. Sign in or learn about subscription options.
pp. 120-123
by
Olivier Ginez
,
Jean-Michel Portal
,
Hassen Aziza
Papers
Power devices current monitoring using horizontal and vertical magnetic force sensor
Full-text access may be available. Sign in or learn about subscription options.
pp. 124-127
by
Martin Donoval
,
Martin Daricek
,
Juraj Marek
,
Viera Stopjakova
Papers
Measurement of power supply noise tolerance of self-timed processor
Full-text access may be available. Sign in or learn about subscription options.
pp. 128-131
by
Kunihiro Asada
,
Taku Sogabe
,
Toru Nakura
,
Makoto Ikeda
Papers
Test scheme for switched-capacitor circuits by digital analyses
Full-text access may be available. Sign in or learn about subscription options.
pp. 132-135
by
Yun-Che Wen
Papers
Structural test of programmed FPGA circuits
Full-text access may be available. Sign in or learn about subscription options.
pp. 136-139
by
Martin Rozkovec
,
Ondrej Novak
Papers
Low voltage precharge CMOS logic
Full-text access may be available. Sign in or learn about subscription options.
pp. 140-143
by
Yngvar Berg
,
Omid Mirmotahari
Papers
MDCT / IMDCT low power implementations in 90 nm CMOS technology for MP3 audio
Full-text access may be available. Sign in or learn about subscription options.
pp. 144-147
by
Peter Malik
,
Michal Ufnal
,
Arkadiusz W. Luczyk
,
Marcel Balaz
,
Witold A. Pleskacz
Papers
Effective mars rover platform design with Hardware / Software co-design
Full-text access may be available. Sign in or learn about subscription options.
pp. 148-151
by
Gabor Marosy
,
Zoltan Kovacs
,
Gyula Horvath
Papers
On the role of the power supply as an entry for common cause faults
Full-text access may be available. Sign in or learn about subscription options.
pp. 152-157
by
Peter Tummeltshammer
,
Andreas Steininger
Papers
An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions
Full-text access may be available. Sign in or learn about subscription options.
pp. 158-163
by
F. Azais
,
Y. Bertrand
,
M. Renovell
Papers
Effective BIST for crosstalk faults in interconnects
Full-text access may be available. Sign in or learn about subscription options.
pp. 164-169
by
Tomasz Rudnicki
,
Tomasz Garbolino
,
Krzysztof Gucwa
,
Andrzej Hlawiczka
Papers
MTPP - Modular Traffic Processing Platform
Full-text access may be available. Sign in or learn about subscription options.
pp. 170-173
by
Jiri Halak
,
Sven Ubik
Papers
Simulation and planning method for on-chip power distribution
Full-text access may be available. Sign in or learn about subscription options.
pp. 174-177
by
Qing K. Zhu
,
Vincent Bars
Papers
Experience in Virtual Testing of RSD cyclic A/D converters
Full-text access may be available. Sign in or learn about subscription options.
pp. 178-181
by
Miloslav Kubar
,
Ondrej Subrt
,
Pravoslav Martinek
,
Jiri Jakovenko
Papers
A 1GHz-GBW operational amplifier for DVB-H receivers in 65nm CMOS
Full-text access may be available. Sign in or learn about subscription options.
pp. 182-185
by
Heimo Uhrmann
,
Franz Schlogl
,
Kurt Schweiger
,
Horst Zimmermann
Papers
0.5V 160-MHz 260uW all digital phase-locked loop
Full-text access may be available. Sign in or learn about subscription options.
pp. 186-193
by
Jen-Chieh Liu
,
Hong-Yi Huang
,
Wei-Bin Yang
,
Kuo-Hsing Cheng
Papers
0.18
Full-text access may be available. Sign in or learn about subscription options.
pp. 194-197
by
Y. C. Chang
,
H. L. Kao
,
C. H. Kao
,
C. H. Yang
,
Jeffrey S. Fu
,
Nemai C. Karmakar
,
L. C. Chang
Papers
Hardware solution of chaos based image encryption
Full-text access may be available. Sign in or learn about subscription options.
pp. 198-201
by
Jiri Giesl
,
Ladislav behal
,
Karel Vlcek
Round-level concurrent error detection applied to Advanced Encryption Standard
Full-text access may be available. Sign in or learn about subscription options.
pp. 270-275
by
Flavius Opritoiu
,
Mircea Vladutiu
,
Mihai Udrescu
,
Lucian Prodan
Papers
Diagnosis of faulty units in regular graphs under the PMC model
Full-text access may be available. Sign in or learn about subscription options.
pp. 202-205
by
M. Manik
,
E. Gramatova
Papers
All digital baseband 50 Mbps data recovery using 5
Full-text access may be available. Sign in or learn about subscription options.
pp. 206-209
by
Sanad Bushnaq
,
Toru Nakura
,
Makoto Ikeda
,
Kunihiro Asada
TTTC: Test Technology Technical Council
Freely available from IEEE.
pp. 282-284
Papers
Contactless characterization of MEMS devices using optical microscopy
Full-text access may be available. Sign in or learn about subscription options.
pp. 210-213
by
Andras Timar
,
Gyorgy Bognar
Papers
A comprehensive approach for soft error tolerant Four State Logic
Full-text access may be available. Sign in or learn about subscription options.
pp. 214-217
by
Werner Friesenbichler
,
Thomas Panhofer
,
Martin Delvai
Papers
High-level symbolic simulation for automatic model extraction
Full-text access may be available. Sign in or learn about subscription options.
pp. 218-221
by
Florent Ouchet
,
Dominique Borrione
,
Katell Morin-Allory
,
Laurence Pierre
Papers
Global parametric faults identification with the use of Differential Evolution
Full-text access may be available. Sign in or learn about subscription options.
pp. 222-225
by
P. Jantos
,
D. Grzechca
,
J. Rutkowski
Papers
Forward and backward guarding in early output logic
Full-text access may be available. Sign in or learn about subscription options.
pp. 226-229
by
Charlie Brej
,
Doug Edwards
Papers
Logic synthesis method for pattern matching circuits implementation in FPGA with embedded memories
Full-text access may be available. Sign in or learn about subscription options.
pp. 230-233
by
Grzegorz Borowik
,
Tadeusz Luba
,
Bogdan J. Falkowski
Papers
Contention-avoiding custom topology generation for network-on-chip
Full-text access may be available. Sign in or learn about subscription options.
pp. 234-237
by
Stanislaw Deniziak
,
Robert Tomaszewski
Papers
Enhanced LEON3 core for superscalar processing
Full-text access may be available. Sign in or learn about subscription options.
pp. 238-241
by
Krzysztof Marcinek
,
Arkadiusz W. Luczyk
,
Witold A. Pleskacz
Papers
Ultra low-voltage switched current mirror
Full-text access may be available. Sign in or learn about subscription options.
pp. 242-245
by
Yngvar Berg
,
Omid Mirmotahari
Papers
Self-timed thermal sensing and monitoring of multicore systems
Full-text access may be available. Sign in or learn about subscription options.
pp. 246-251
by
Kameswar Rao Vaddina
,
Ethiopia Nigussie
,
Pasi Liljeberg
,
Juha Plosila
Papers
A CMOS bio-impedance measurement system
Full-text access may be available. Sign in or learn about subscription options.
pp. 252-257
by
Alberto Yufera
,
Adoracion Rueda
An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs
Full-text access may be available. Sign in or learn about subscription options.
pp. 258-263
by
L. Ciganda
,
F. Abate
,
P. Bernardi
,
M. Bruno
,
M. Sonza Reorda
Papers
Comprehensive bridging fault diagnosis based on the SLAT paradigm
Full-text access may be available. Sign in or learn about subscription options.
pp. 264-269
by
Y. Benabboud
,
A. Bosio
,
L. Dilillo
,
P. Girard
,
S. Pravossoudovitch
,
A. Virazel
,
L. Bouzaida
,
I. Izaute
Papers
Author index
Freely available from IEEE.
pp. 276-277
Showing 66 out of 66