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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.

Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime

Year: 2004, Pages: 87-95
DOI Bookmark: 10.1109/DFT.2004.41

Authors

Mohamed Abbas, University of Tokyo, Japan  
Makoto Ikeda, University of Tokyo, Japan  
Kunihiro Asada, University of Tokyo, Japan
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Abstract