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Proceedings. 6th European Dependable Computing Conference

Oct. 18 2006 to Oct. 20 2006

Coimbra

Table of Contents

Communication Integrity in Networks for Critical Control SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 23-34
Introduction
ForewordFreely available from IEEE.
Introduction
PrefaceFreely available from IEEE.pp. ix-x
Introduction
Committee OrganizationFreely available from IEEE.pp. xi-xii
Introduction
External RefereesFreely available from IEEE.pp. xiii
Session 1: Robustness and Fault Tolerance
Construction of a Highly Dependable Operating SystemFull-text access may be available. Sign in or learn about subscription options.pp. 3-12
Session 1: Robustness and Fault Tolerance
Automatically Finding and Patching Bad Error HandlingFull-text access may be available. Sign in or learn about subscription options.pp. 13-22
Session 2A: Practical Experience Reports and Tools
A fault tolerant VoIP implementation based on open standardsFull-text access may be available. Sign in or learn about subscription options.pp. 35-38
Session 2A: Practical Experience Reports and Tools
Lessons learned from the deployment of a high-interaction honeypotFull-text access may be available. Sign in or learn about subscription options.pp. 39-46
Session 3: Fault Injection
Temporal Characterization of Embedded Systems Using NexusFull-text access may be available. Sign in or learn about subscription options.pp. 47-52
Session 3: Fault Injection
Injection of faults at component interfaces and inside the component code: are they equivalent?Full-text access may be available. Sign in or learn about subscription options.pp. 53-64
Panel 1: In Search of Real Data on Faults, Errors, and Failures
In Search of Real Data on Faults, Errors and FailuresFull-text access may be available. Sign in or learn about subscription options.pp. 65
Panel 1: In Search of Real Data on Faults, Errors, and Failures
The Hide and Seek Field Data GameFull-text access may be available. Sign in or learn about subscription options.pp. 66-68
Panel 1: In Search of Real Data on Faults, Errors, and Failures
Measurement-Based Analysis: A Key to Experimental Research in DependabilityFull-text access may be available. Sign in or learn about subscription options.pp. 69-70
Panel 1: In Search of Real Data on Faults, Errors, and Failures
Improving access to relevant data on faults, errors and failures in real systemsFull-text access may be available. Sign in or learn about subscription options.pp. 71-72
Panel 1: In Search of Real Data on Faults, Errors, and Failures
Confidentiality and Real Errors: A Contradiction?Full-text access may be available. Sign in or learn about subscription options.pp. 73-76
Session 4A: Hardware Implemented Fault Tolerance
SEU Mitigation Techniques for Microprocessor Control LogicFull-text access may be available. Sign in or learn about subscription options.pp. 77-86
Session 4A: Hardware Implemented Fault Tolerance
Fault-Tolerant Distributed Clock Generation in VLSI Systems-on-ChipFull-text access may be available. Sign in or learn about subscription options.pp. 87-96
Session 4A: Hardware Implemented Fault Tolerance
Dynamic Derivation of Application-Specific Error Detectors and their Implementation in HardwareFull-text access may be available. Sign in or learn about subscription options.pp. 97-108
Session 6A: Dependable Storage and Services
Impact ofWAN Channel Behavior on End-to-end Latency of Replication ProtocolsFull-text access may be available. Sign in or learn about subscription options.pp. 109-118
Session 6A: Dependable Storage and Services
Customizable Service State Durability for Service Oriented ArchitecturesFull-text access may be available. Sign in or learn about subscription options.pp. 119-128
Session 6A: Dependable Storage and Services
Storage Tradeoffs in a Collaborative Backup Service for Mobile DevicesFull-text access may be available. Sign in or learn about subscription options.pp. 129-138
Session 6A: Dependable Storage and Services
Rephrasing Rules for Off-The-Shelf SQL Database ServersFull-text access may be available. Sign in or learn about subscription options.pp. 139-148
Author Index
Author IndexFreely available from IEEE.pp. 149
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