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Computer-Aided Design, International Conference on

Nov. 5 2006 to Nov. 9 2006

San Jose, CA

ISSN: 1092-3152

Table of Contents

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Monday Panel: CAD Research, Pay Now or Pay Later...Freely available from IEEE.pp. 17
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Adaptive multi-domain thermal modeling and analysis for integrated circuit synthesis and designFull-text access may be available. Sign in or learn about subscription options.pp. 575-582
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ICCAD 2990 International Conference on Computer Aided DesignFreely available from IEEE.pp. 1
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Conference CommitteeFreely available from IEEE.pp. 3
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ICCAD-2006 Technical Program CommitteeFreely available from IEEE.pp. 4-5
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ICCAD-2006 ReviewersFreely available from IEEE.pp. 6-7
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ForewordFreely available from IEEE.pp. 8
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ICCAD-2006 AwardsFull-text access may be available. Sign in or learn about subscription options.pp. 9
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Enabling Variability Aware AnalysisFull-text access may be available. Sign in or learn about subscription options.pp. 11
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DFM: Impact of Manufacturing Reality on DesignFull-text access may be available. Sign in or learn about subscription options.pp. 11
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Power and Thermal Challenges for 65 nm and BelowFull-text access may be available. Sign in or learn about subscription options.pp. 12
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Enhancing Yield at 45nm: DFM Solutions from Different PerspectivesFull-text access may be available. Sign in or learn about subscription options.pp. 13
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Transistor, Cell, and Interconnect Modeling: Basics to AdvancesFull-text access may be available. Sign in or learn about subscription options.pp. 14
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Advanced Routing Techniques for Nanometer IC DesignsFull-text access may be available. Sign in or learn about subscription options.pp. 15
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Design/Technology ConvergenceFreely available from IEEE.pp. 16
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Table of ContentsFull-text access may be available. Sign in or learn about subscription options.pp. 18-30
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Author IndexFreely available from IEEE.pp. 31-40
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Copyright pageFreely available from IEEE.pp. 41
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Dynamic Power Management Using Machine LearningFull-text access may be available. Sign in or learn about subscription options.pp. 747-754
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Dynamic Voltage and Frequency Management Based on Variable Update Intervals for Frequency SettingFull-text access may be available. Sign in or learn about subscription options.pp. 755-760
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Temperature-Aware Leakage Minimization Technique for Real-Time SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 761-764
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Energy Budgeting for Battery-Powered Sensors with a Known Task ScheduleFull-text access may be available. Sign in or learn about subscription options.pp. 765-771
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Stepping Forward with Interpolants in Unbounded Model CheckingFull-text access may be available. Sign in or learn about subscription options.pp. 772-778
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Decomposing Image Computation for Symbolic Reachability Analysis Using Control Flow InformationFull-text access may be available. Sign in or learn about subscription options.pp. 779-785
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Automatic Memory Reductions for RTL Model VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 786-793
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Accelerating High-level Bounded Model CheckingFull-text access may be available. Sign in or learn about subscription options.pp. 794-801
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Simultaneous Power and Thermal Integrity Driven Via Stapling in 3D ICsFull-text access may be available. Sign in or learn about subscription options.pp. 802-808
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Yield Prediction for 3D Capacitive InterconnectionsFull-text access may be available. Sign in or learn about subscription options.pp. 809-814
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Layer Minimization of Escape Routing in Area Array PackagingFull-text access may be available. Sign in or learn about subscription options.pp. 815-819
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Network Coding for Routability Improvement in VLSIFull-text access may be available. Sign in or learn about subscription options.pp. 820-823
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From Micro to Nano: MEMS as an interface to the nano worldFull-text access may be available. Sign in or learn about subscription options.pp. 824-825
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CMOS-MEMS Integration: Why, How and What?Full-text access may be available. Sign in or learn about subscription options.pp. 826-827
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Information Processing in Nanoscale Arrays: DNA Assembly, Molecular Devices, Nano-Array ArchitecturesFull-text access may be available. Sign in or learn about subscription options.pp. 828-829
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Molecular Organic Electronic CircuitsFull-text access may be available. Sign in or learn about subscription options.pp. 830-831
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Organic Electronic Device Modeling at the NanoscaleFull-text access may be available. Sign in or learn about subscription options.pp. 832-833
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Variability and yield improvement: rules, models, and characterizationFull-text access may be available. Sign in or learn about subscription options.pp. 834-835
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Improvements to Combinational Equivalence CheckingFull-text access may be available. Sign in or learn about subscription options.pp. 836-843
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SMT(CLU): A Step toward Scalability in System VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 844-851
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Solving the Minimum-Cost Satisfiability Problem Using SAT Based Branch-and-Bound SearchFull-text access may be available. Sign in or learn about subscription options.pp. 852-859
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Veri cation Through the Principle of Least AstonishmentFull-text access may be available. Sign in or learn about subscription options.pp. 860-867
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Performance-Oriented Statistical Parameter Reduction of Parameterized Systems via Reduced Rank RegressionFull-text access may be available. Sign in or learn about subscription options.pp. 868-875
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Faster, Parametric Trajectory-based Macromodels Via Localized Linear ReductionsFull-text access may be available. Sign in or learn about subscription options.pp. 876-883
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Robust Estimation of Parametric Yield under Limited Descriptions of UncertaintyFull-text access may be available. Sign in or learn about subscription options.pp. 884-890
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From molecular interactions to gates: a systematic approachFull-text access may be available. Sign in or learn about subscription options.pp. 891-898
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A Spectrally Accurate Integral Equation Solver for Molecular Surface ElectrostaticsFull-text access may be available. Sign in or learn about subscription options.pp. 899-906
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Using CAD to Shape Experiments in Molecular QCAFull-text access may be available. Sign in or learn about subscription options.pp. 907-914
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Stable and Compact Inductance Modeling of 3-D Interconnect StructuresFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
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A Fast Block Structure Preserving Model Order Reduction for Inverse Inductance CircuitsFull-text access may be available. Sign in or learn about subscription options.pp. 7-12
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Fullwave Volumetric Maxwell solver using Conduction ModesFull-text access may be available. Sign in or learn about subscription options.pp. 13-18
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Joint Design-Time and Post-Silicon Minimization of Parametric Yield Loss using Adjustable Robust OptimizationFull-text access may be available. Sign in or learn about subscription options.pp. 19-26
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Optimal Useful Clock Skew Scheduling In the Presence of Variations Using Robust ILP FormulationsFull-text access may be available. Sign in or learn about subscription options.pp. 27-32
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State Re-Encoding for Peak Current MinimizationFull-text access may be available. Sign in or learn about subscription options.pp. 33-38
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A Statistical Framework for Post-Silicon Tuning through Body Bias ClusteringFull-text access may be available. Sign in or learn about subscription options.pp. 39-46
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A Gate Delay Model Focusing on Current Fluctuation over Wide-Range of Process and Environmental VariabilityFull-text access may be available. Sign in or learn about subscription options.pp. 47-53
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Practical Variation-Aware Interconnect Delay and Slew Analysis for Statistical Timing VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 54-59
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Analysis and Modeling of CD Variation for Statistical Static TimingFull-text access may be available. Sign in or learn about subscription options.pp. 60-66
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From Single Core to Multi-Core: Preparing for a new exponentialFull-text access may be available. Sign in or learn about subscription options.pp. 67-72
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UML for ESL Design - Basic Principles, Tools, and ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 73-80
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On Bounding the Delay of a Critical PathFull-text access may be available. Sign in or learn about subscription options.pp. 81-88
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A Delay Fault Model for At-Speed Fault Simulation and Test GenerationFull-text access may be available. Sign in or learn about subscription options.pp. 89-95
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Efficient Boolean Characteristic Function for Fast Timed ATPGFull-text access may be available. Sign in or learn about subscription options.pp. 96-99
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Exploring Linear Structures of Critical Path Delay Faults to Reduce Test EffortsFull-text access may be available. Sign in or learn about subscription options.pp. 100-106
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Fast Decap Allocation Based on Algebraic MultigridFull-text access may be available. Sign in or learn about subscription options.pp. 107-111
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Precise Identification of the Worst-Case Voltage Drop Conditions in Power Grid VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 112-118
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Importance of Volume Discretization of Single and Coupled InterconnectsFull-text access may be available. Sign in or learn about subscription options.pp. 119-126
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Handling Inductance in Early Power Grid VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 127-134
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Mapping Arbitrary Logic Functions into Synchronous Embedded Memories For Area Reduction on FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 135-142
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Factor CutsFull-text access may be available. Sign in or learn about subscription options.pp. 143-150
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An Efficient Technique for Synthesis and Optimization of Polynomials in GF(2m)Full-text access may be available. Sign in or learn about subscription options.pp. 151-157
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Cost-aware synthesis of asynchronous circuits based on partial acknowledgementFull-text access may be available. Sign in or learn about subscription options.pp. 158-163
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A Revisit to Floorplan Optimization by Lagrangian RelaxationFull-text access may be available. Sign in or learn about subscription options.pp. 164-171
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Fast Wire Length Estimation by Net Bundling for Block PlacementFull-text access may be available. Sign in or learn about subscription options.pp. 172-178
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Fast and Robust Quadratic Placement Combined with an Exact Linear Net ModelFull-text access may be available. Sign in or learn about subscription options.pp. 179-186
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Testing Delay Faults in Asynchronous Handshake CircuitsFull-text access may be available. Sign in or learn about subscription options.pp. 193-197
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A Novel Framework for Faster-than-at-Speed Delay Test Considering IR-drop EffectsFull-text access may be available. Sign in or learn about subscription options.pp. 198-203
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Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniquesFull-text access may be available. Sign in or learn about subscription options.pp. 204-209
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Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN TransceiversFull-text access may be available. Sign in or learn about subscription options.pp. 210-216
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A Linear-Time Approach for Static Timing Analysis Covering All Process CornersFull-text access may be available. Sign in or learn about subscription options.pp. 217-224
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A Framework for Statistical Timing Analysis using Non-Linear Delay and Slew ModelsFull-text access may be available. Sign in or learn about subscription options.pp. 225-230
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An Accurate Sparse Matrix Based Framework for Statistical Static Timing AnalysisFull-text access may be available. Sign in or learn about subscription options.pp. 231-236
Robust System-Level Design with Analog PlatformsFull-text access may be available. Sign in or learn about subscription options.pp. 334-341
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A New Statistical Max Operation for Propagating Skewness in Statistical Timing AnalysisFull-text access may be available. Sign in or learn about subscription options.pp. 237-243
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Cache Miss Clustering for Banked Memory SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 244-250
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A Bitmask-based Code Compression Technique for Embedded SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 251-254
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Allocation Cost Minimization for Periodic Hard Real-Time Tasks in Energy-Constrained DVS SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 255-260
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Application-Specific Customization of Parameterized FPGA Soft-Core ProcessorsFull-text access may be available. Sign in or learn about subscription options.pp. 261-268
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TP-PPV: Piecewise Nonlinear, Time-Shifted Oscillator Macromodel Extraction For Fast, Accurate PLL SimulationFull-text access may be available. Sign in or learn about subscription options.pp. 269-274
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Verification of Analog/Mixed-Signal Circuits Using Labeled Hybrid Petri NetsFull-text access may be available. Sign in or learn about subscription options.pp. 275-282
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PPV-HB: Harmonic Balance for Oscillator/PLL Phase MacromodelsFull-text access may be available. Sign in or learn about subscription options.pp. 283-288
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Loop Pipelining for High-Throughput Stream Computation Using Self-Timed RingsFull-text access may be available. Sign in or learn about subscription options.pp. 289-296
Decoupling Capacitor Planning and Sizing For Noise and Leakage ReductionFull-text access may be available. Sign in or learn about subscription options.pp. 395-400
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Thermal-Induced Leakage Power Optimization by Redundant Resource AllocationFull-text access may be available. Sign in or learn about subscription options.pp. 297-302
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Guaranteeing Performance Yield in High-Level SynthesisFull-text access may be available. Sign in or learn about subscription options.pp. 303-309
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Information Theoretic Approach to Address Delay and Reliability in Long On-Chip InterconnectsFull-text access may be available. Sign in or learn about subscription options.pp. 310-314
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Analytical Modeling of SRAM Dynamic StabilityFull-text access may be available. Sign in or learn about subscription options.pp. 315-322
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