Default Cover Image

2015 16th Latin-American Test Symposium (LATS)

March 25 2015 to March 27 2015

Puerto Vallarta, Mexico

Table of Contents

LATS2015 CommitteesFreely available from IEEE.pp. 1-3
Table of contents (technical program)Freely available from IEEE.pp. 1-9
[Copyright notice]Freely available from IEEE.pp. 1-1
Efficient fault injection in QEMUFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Complex delay fault reasoning with sequential 7-valued algebraFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Test set generation almost for free using a run-time FPGA reconfiguration techniqueFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
An evolutionary approach for test program compactionFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
A digital technique for the evaluation of SSB phase noise of analog/RF signalsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Single event effects in an analog SOI transconductor: a case studyFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
Improving logic obfuscation via logic cone analysisFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Virtual reconfigurable scan-chains on FPGAs for optimized board testFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
A controllable setup and propagation delay flip-flop designFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
SW-based transparent in-field memory testingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Effective selection of favorable gates in BTI-critical paths to enhance circuit reliabilityFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Adopting multi-valued logic for reduced pin-count testingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Design dependent SRAM PUF robustness analysisFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
NBTI-induced circuit aging optimization by protectability-aware gate replacement techniqueFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
Optimizing operational amplifiers by metaheuristics and considering tolerance analysisFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
Study of regression methodologies on analog circuit designFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
A multi-layer software-based fault-tolerance approach for heterogenous multi-core systemsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Test compression for circuits with multiple scan chainsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
"Safe" built-in test and tuning of boost converters using feedback loop perturbationsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
A method of one-pass seed generation for LFSR-based deterministic/pseudo-random testing of static faultsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Power distribution network analysis using semi irregular plane shape approach and via modelingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Exemplar-based failure triage for regression design debuggingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Fault-tolerance in FPGA focusing power reduction or performance enhancementFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
NBTI-aware design of integrated circuits: a hardware-based approachFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
Scan based two-pattern tests: should they target opens instead of TDFs?Full-text access may be available. Sign in or learn about subscription options.pp. 1-2
Design of ultra-low-power smart wearable systemsFull-text access may be available. Sign in or learn about subscription options.pp. 1-2
In-field test of safety-critical systems: is functional test a feasible solution?Full-text access may be available. Sign in or learn about subscription options.pp. 1-2
Showing 52 out of 52