Adam Cron is a Distinguished Architect at Synopsys working with customers worldwide on complex Test, Security, and Silicon Lifecycle Management tool flows and architectures for digital ICs. He has helped architect design-for-test, design-for-manufacturing, and security tools for several generations of products. As a Syracuse University Computer Engineering graduate, Adam also worked in test-related fields at Motorola and Texas Instruments where he got his first exposure to IEEE standards while designing the first ICs compliant to IEEE Std 1149.1. Adam is Chair of IEEE Std 1838 which standardized 3D-IC test access, Editor of IEEE Std 1149.4 for a mixed-signal test bus, Vice-Chair of the IEEE Standards Association’s Test Technology Standards Committee which oversees the development of IEEE Test standards, and an IEEE Golden Core recipient for long-standing service to the society. He has authored several papers and book chapters and is a frequent speaker at conference sessions held at events such as ITC (International Test Conference) and DAC (Design Automation Conference). He now serves as a member of the Heterogeneous Integration Roadmap Test Technical Working Group and is also chairing a working group to create a Rest API for MITRE’s CWE (Common Weakness Enumeration) security databases.
