HITS: High-coverage LLM-based Unit Test Generation via Method Slicing

Zejun Wang; Kaibo Liu; Ge Li; Zhi Jin

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2024 39th IEEE/ACM International Conference on Automated Software Engineering (ASE)

HITS: High-coverage LLM-based Unit Test Generation via Method Slicing

Year: 2024, Pages: 1258-1268

Authors

Zejun Wang, MOE; SCS,Key Lab of HCST (PKU),Beijing,China
Kaibo Liu, MOE; SCS,Key Lab of HCST (PKU),Beijing,China
Ge Li, MOE; SCS,Key Lab of HCST (PKU),Beijing,China
Zhi Jin, MOE; SCS,Key Lab of HCST (PKU),Beijing,China

HITS: High-coverage LLM-based Unit Test Generation via Method Slicing

Authors

Abstract