Longest path selection for delay test under process variation

X. Lu; Z. Li; W. Qiu; D.M.H. Walker; W. Shi

doi:10.1109/ASPDAC.2004.1337547

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ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004

Longest path selection for delay test under process variation

Year: 2004, Pages: 98-103

DOI Bookmark: 10.1109/ASPDAC.2004.1337547

Authors

X. Lu, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Z. Li, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
W. Qiu
D.M.H. Walker
W. Shi

Longest path selection for delay test under process variation

Authors

Abstract