Abstract
In this paper, we improve the previous method by enhancing a set of diagnostic tests and using an EB testing method. We first enhance the previous set of diagnostic tests to one of diagnostic tests consisting of the four sets, TP-1, TP-2, TP-3 and TP-4. We next present two diagnostic methods by using the enhanced diagnostic tests and an electron-beam tester (EB-tester). Experimental results show that the presented method identified fault locations within 0.2 to 5% of all stuck-at faults on all lines in the circuit by probing about 0.8 to 15% internal lines.