Abstract
Current design trends have shown that crosstalk issues in deep sub-micron can cause severe design validation and test problems. This paper addresses the problem of delay testing considering crosstalk-induced delay effects. A delay test pattern generation technique is proposed base on waveform sensitization. Crosstalk-induced effects on critical paths are targeted to improve test effectiveness of delay testing. Experimental results show the efficiency of this technique. It can be applied to circuits of reasonable sizes by generating delay tests considering crosstalk-induced effects within an acceptable amount of time.