14th Asian Test Symposium (ATS'05)
A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture
DOI Bookmark: 10.1109/ATS.2005.17
Authors
Tsuyoshi Shinogi, Mie University, Tsu, Mie, JAPANHiroyuki Yamada, Mie University, Tsu, Mie, JAPAN
Terumine Hayashi, Mie University, Tsu, Mie, JAPAN
Shinji Tsuruoka, Mie University, Tsu, Mie, JAPAN
Tomohiro Yoshikawa, Nagoya University, Nagoya, JAPAN