Spectral RTL Test Generation for Gate-Level Stuck-at Faults

We model RTL faults as stuck-at faults on primary inputs, primary outputs, and ip- ops. Tests for these faults are analyzed using Hadamard matrices for Walsh functions and random noise level at each primary input. This information then helps generate vector sequences. At the gate-level, a fault simulator and an integer lin- ear program (ILP) compact the test sequences. We give results for four ITC'99 and four ISCAS'89 bench- mark circuits, and an experimental processor. The RTL spectral vectors performed equally well on mul- tiple gate-level implementations. Compared to a gate- level ATPG, RTL vectors produced similar or higher coverage in shorter CPU times.