Preventing Scan Attack through Test Response Encryption

Satyadev Ahlawat; Jaynarayan Tudu; Manoj Singh Gaur; Masahiro Fujita; Virendra Singh

doi:10.1109/DFT.2019.8875355

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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Preventing Scan Attack through Test Response Encryption

Year: 2019, Pages: 1-6

DOI Bookmark: 10.1109/DFT.2019.8875355

Authors

Satyadev Ahlawat, Indian Institute of Technology, Jammu, India
Jaynarayan Tudu, Indian Institute of Technology, Tirupati, India
Manoj Singh Gaur, Indian Institute of Technology, Jammu, India
Masahiro Fujita, VLSI Design and Education Centre, The University of Tokyo, Japan
Virendra Singh, Indian Institute of Technology, Bombay, India

Preventing Scan Attack through Test Response Encryption

Authors

Abstract