Testing the Path Delay Faults of ISCAS85 Circuit c6288

Wangqi Qiu; D. M. H. Walker

doi:10.1109/MTV.2003.1250258

Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions

Testing the Path Delay Faults of ISCAS85 Circuit c6288

Year: 2003, Pages: 19

DOI Bookmark: 10.1109/MTV.2003.1250258

Authors

Wangqi Qiu, Texas A&M University
D. M. H. Walker, Texas A&M University

Abstract

It is known that the ISCAS85 circuit c6288 contains an exponential number of paths and more than 99% of the path delay faults are untestable. Most ATPG tools which can efficiently handle other circuits fail on c6288. In this paper the logic structure of c6288 is studied and the main features which cause false paths are revealed. A heuristic which significantly helps the path delay fault test generation for this circuit is presented. Experimental results show that our methodology is able to efficiently generate testable paths for c6288.

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Testing the Path Delay Faults of ISCAS85 Circuit c6288

Authors

Abstract

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