2008 IEEE International Test Conference
SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects
DOI Bookmark: 10.1109/TEST.2008.4700620
Authors
Feng Yuan, CUhk REliable computing laboratory (CURE), Dept. of Computer Science & Engineering, The Chinese University of Hong Kong. Email: fyuan@cse.cuhk.edu.hkQiang Xu, CUhk REliable computing laboratory (CURE), Dept. of Computer Science & Engineering, The Chinese University of Hong Kong; CAS-CUHK Shenzhen Institute of Advanced Integration Technology. Email: qxu@cse.cuhk.edu.hk