VLSI Design, International Conference on
Influence of Leakage Reduction Techniques on Delay/Leakage Uncertainty
DOI Bookmark: 10.1109/ICVD.2005.111
Authors
Yuh-Fang Tsai, Penn State UniversityN. Vijaykrishnan, Penn State University
Yuan Xie, Penn State University
Mary Jane Irwin, Penn State University