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Proceedings
CVPR
CVPR 2003
2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings.
Estimating Surface Characteristics using Physical Reflectance Models
Year: 2003, Volume: 3, Pages: 177
DOI Bookmark:
10.1109/CVPR.2003.1211468
Authors
Hossein Ragheb
,
University of York
Edwin R. Hancock
,
University of York
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