2012 IEEE Conference on Computer Vision and Pattern Recognition
Neighborhood repulsed metric learning for kinship verification
DOI Bookmark: 10.1109/CVPR.2012.6247978
Authors
Gang Wang, Adv. Digital Sci. Center, Singapore, SingaporeYap-Peng Tan, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Yuanyuan Shang, Sch. of Inf. Eng., Capital Normal Univ., Beijing, China
Xiuzhuang Zhou, Sch. of Inf. Eng., Capital Normal Univ., Beijing, China
Junlin Hu, Coll. of Inf. Sci. & Technol., Beijing Normal Univ., Beijing, China
Jiwen Lu, Adv. Digital Sci. Center, Singapore, Singapore