2018 IEEE East-West Design & Test Symposium (EWDTS)
Compact SPICE Models of the Standard Layout Fragments in LSI Interconnections
DOI Bookmark: 10.1109/EWDTS.2018.8524730
Authors
K.O. Petrosyants, (Moscow Institute of Electronics and Mathematics), National Research University Higher School of EconomicsN.I. Ryabov, (Moscow Institute of Electronics and Mathematics), National Research University Higher School of Economics
E.I. Batarueva, (Moscow Institute of Electronics and Mathematics), National Research University Higher School of Economics