2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
NIM- a noise index model to estimate delay discrepancies between silicon and simulation
DOI Bookmark: 10.1109/DATE.2010.5457025
Authors
Elif Alpaslan, Division of Engineering, Brown University, Providence, USAJennifer Dworak, Division of Engineering, Brown University, Providence, USA
Bram Kruseman, NXP Semiconductors High Tech Campus, Eindhoven, The Netherlands
Ananta K. Majhi, NXP Semiconductors High Tech Campus, Eindhoven, The Netherlands
Wilmar M. Heuvelman, NXP Semiconductors High Tech Campus, Eindhoven, The Netherlands
Paul van de Wiel, NXP Semiconductors High Tech Campus, Eindhoven, The Netherlands