Analysis and comparison of functional verification and ATPG for testing design reliability

M. Simkova; Z. Kotasek; C. Bolchini

doi:10.1109/DDECS.2013.6549833

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2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Analysis and comparison of functional verification and ATPG for testing design reliability

Year: 2013, Pages: 275-278

DOI Bookmark: 10.1109/DDECS.2013.6549833

Authors

M. Simkova, Fac. of Inf. Technol., Brno Univ. of Technol., Brno, Czech Republic
Z. Kotasek, Fac. of Inf. Technol., Brno Univ. of Technol., Brno, Czech Republic
C. Bolchini, Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy

Analysis and comparison of functional verification and ATPG for testing design reliability

Authors

Abstract