Abstract
The paper deals with a new approach to selection of the optimum value of the oscillation frequency towards increasing the efficiency of the oscillation-based test methods in covering hard-detectable short faults in nanoscale technologies. For this purpose, the Describing-Function analysis was used to calculate of the oscillation frequency of a simple oscillator (an analog circuit under test) modeled in MATLAB. Accuracy of the model was evaluated through comparison of computed parameters to parameters achieved for the same circuit in Cadence.