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Proceedings
DELTA
DELTA 2008
Electronic Design, Test and Applications, IEEE International Workshop on
Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction
Year: 2008, Pages: 308-313
DOI Bookmark:
10.1109/DELTA.2008.56
Authors
Yong-sheng Cheng
Zhi-qiang You
Ji-shun Kuang
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