Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources
Career Center
Tech News
Resource Center
Press Room
Advertising
Librarian Resources
IEEE.org
Help
About Us
Career Center
Cart
Create Account
Sign In
Toggle navigation
My Subscriptions
Browse Content
Resources
All
Previous
Next
Table of Contents
Home
Proceedings
DFT
DFT 2001
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
High Level Modifications of VHDL Descriptions for On-Line Test or Fault Tolerance
Year: 2001, Pages: 0084
DOI Bookmark:
10.1109/DFTVS.2001.966756
Authors
R. Leveugle
,
TIMA Laboratory
R. Cercueil
,
TIMA Laboratory
Download PDF
SHARE ARTICLE
Generate Citation
Abstract
