2006 21st IEEE International Symposium On Defect and Fault Tolerance in VLSI Systems
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
DOI Bookmark: 10.1109/DFT.2006.65
Authors
Zhiyuan He, Embedded Systems Laboratory, Linkoping University, SwedenZebo Peng, Embedded Systems Laboratory, Linkoping University, Sweden
Petru Eles, Embedded Systems Laboratory, Linkoping University, Sweden
Paul Rosinger, School of Electronics and Computer Science, University of Southampton, UK
Bashir M. Al-hashimi, School of Electronics and Computer Science, University of Southampton, UK