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Proceedings
DFT
DFT 2010
2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems
SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements
Year: 2010, Pages: 167-171
DOI Bookmark:
10.1109/DFT.2010.27
Authors
Srikanth V. Devarapalli
Payman Zarkesh-Ha
Steven C. Suddarth
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Abstract
