In-field functional test programs development flow for embedded FPUs

R. Cantoro; D. Piumatti; P. Bernardi; S. De Luca; A. Sansonetti

doi:10.1109/DFT.2016.7684079

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2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

In-field functional test programs development flow for embedded FPUs

Year: 2016, Pages: 107-110

DOI Bookmark: 10.1109/DFT.2016.7684079

Authors

R. Cantoro, Politecnico di Torino - Dipartimento di Automatica e Informatica - Italy
D. Piumatti, Politecnico di Torino - Dipartimento di Automatica e Informatica - Italy
P. Bernardi, Politecnico di Torino - Dipartimento di Automatica e Informatica - Italy
S. De Luca, STMicroelectronics, Italy
A. Sansonetti, STMicroelectronics, Italy

In-field functional test programs development flow for embedded FPUs

Authors

Abstract