Abstract
Many VLSI integrated circuit processing defects can cause changes in the behaviour of the quiescent power supply current. Testing techniques based on the quiescent power supply current inspection have been reported to be efficient in the detection of a wide range of physical defects. In this paper we present one approach to Iddq testing based on the application of BIC sensors to a cell library design methodology. The size of the sensor will depend on the length of the row as well as on the frequency of the circuit under test.