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Proceedings
DSN-W
DSN-W 2017
2017 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshop (DSN-W)
DRAM Scaling Error Evaluation Model Using Various Retention Time
Year: 2017, Pages: 177-183
DOI Bookmark:
10.1109/DSN-W.2017.48
Authors
Seong-Lyong Gong
Jungrae Kim
Mattan Erez
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Abstract
