Design, Test, Integration and Packaging of MEMS/MOEMS, Symposium on
Calculation of partial capacitances using a modified iterative complex image method
DOI Bookmark: 10.1109/DTIP.2003.1287014
Authors
S. Rehfuss, Inst. for Electromagn. Theor. & Microelectron., Bremen Univ., GermanyC. Gorecki, Inst. for Electromagn. Theor. & Microelectron., Bremen Univ., Germany
D. Peters, Inst. for Electromagn. Theor. & Microelectron., Bremen Univ., Germany
R. Laur, Inst. for Electromagn. Theor. & Microelectron., Bremen Univ., Germany