Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources
Career Center
Tech News
Resource Center
Press Room
Advertising
Librarian Resources
IEEE.org
Help
About Us
Career Center
Cart
Create Account
Sign In
Toggle navigation
My Subscriptions
Browse Content
Resources
All
Previous
Next
Table of Contents
Related Articles
Home
Proceedings
ETS
ETS 2011
2011 16th IEEE European Test Symposium (ETS)
Memory Optimized Two-Stimuli INL Test Method for DAC-ADC Pairs
Year: 2011, Pages: 25-32
DOI Bookmark:
10.1109/ETS.2011.29
Authors
Esa Korhonen
Juha Kostamovaara
Download PDF
SHARE ARTICLE
Generate Citation
Abstract
