2012 17th IEEE European Test Symposium (ETS)
Adaptive testing of chips with varying distributions of unknown response bits
DOI Bookmark: 10.1109/ETS.2012.6233023
Authors
Chandra K. H. Suresh, New York University, Abu DhabiOzgur Sinanoglu, New York University, Abu Dhabi
Sule Ozev, Arizona State University