2013 18th IEEE European Test Symposium (ETS 2013)
New test compression scheme based on low power BIST
DOI Bookmark: 10.1109/ETS.2013.6569374
Authors
J. Tyszer, Poznań University of Technology 60-965 Poznań, PolandM. Filipek, Poznań University of Technology 60-965 Poznań, Poland
G. Mrugalski, Mentor Graphics Corporation Wilsonville, OR 97070, USA
N. Mukherjee, Mentor Graphics Corporation Wilsonville, OR 97070, USA
J. Rajski, Mentor Graphics Corporation Wilsonville, OR 97070, USA