Abstract
Nowadays Integrated Circuits (IC)s frequencies causes switching noises. To minimize the mentioned issue in IC designs were used decoupling capacitor (decap) cells to filter out noise in power network. In this paper, have been discussed two approaches of using decap cells in Universal Serial Bus Test Chip (USB TC). Firstly, designed USB TC with decoupling capacitor cells which place over the chip by fixed spaces and secondly instead of this using decoupling capacitors as a filler cells in white spaces. By using this approach, noise on the USB TC chip power rails reduced 45% in worst case scenario.