2023 IEEE East-West Design & Test Symposium (EWDTS)
Functional Verification of Multiport SRAM Memories Based on UVM
DOI Bookmark: 10.1109/EWDTS59469.2023.10297116
Authors
Oleg Petrosyan, National Polytechnic University of Armenia,Yerevan,ArmeniaArman Manukyan, National Polytechnic University of Armenia,Yerevan,Armenia