2020 International Conference on High Performance Big Data and Intelligent Systems (HPBD&IS)
MDD-Net: A novel defect detection model of material microscope image
DOI Bookmark: 10.1109/HPBDIS49115.2020.9130591
Authors
Weiyu Zhou, Faculty of Information Technology, Beijing University of Technology,Beijing,ChinaHairong Yan, Faculty of Information Technology, Beijing University of Technology,Beijing,China
Yuefei Zhang, Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology,Beijing,China