19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.
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Abstract

This paper proposes a digital design methodology aiming at introducing certain degrees of reliability in case of hardware failures. Three main differences with respect to the traditional design methodologies for reliability are introduced: first, the peculiarities of the specification language are taken into account by exploiting the features of SystemC to introduce fault detection properties; second, different techniques are considered to determine the best cost/performance trade-off; third, the adoption of the desired reliability properties is carried out transparently to the designer. The three aspects together characterize the proposed approach, presented here through its application to a FIR circuit.
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