Accurate and efficient evaluation of circuit yield and yield gradients

P. Feldmann; S.W. Director

doi:10.1109/ICCAD.1990.129857

1990 IEEE International Conference on Computer-Aided Design

Accurate and efficient evaluation of circuit yield and yield gradients

Year: 1990, Pages: 120,121,122,123

DOI Bookmark: 10.1109/ICCAD.1990.129857

Authors

P. Feldmann, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
S.W. Director, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Abstract

A method is described for estimating the yield and yield gradient based on a priori geometric approximation of the acceptability region in the disturbance space. Circuit performance macromodeling is used to construct the acceptability region approximation. While yield evaluation can be carried out in either the performance space or parameter space, it is shown that for monolithic integrated circuits, the gradient of yield can only be estimated accurately in the disturbance space.<>

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Accurate and efficient evaluation of circuit yield and yield gradients

Authors

Abstract

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