2005 International Conference on Computer Design
Enhanced dual-transition probabilistic power estimation with selective supergate analysis
DOI Bookmark: 10.1109/ICCD.2005.49
Authors
Fei Hu, Dept. of Electr. & Comput. Eng., Auburn Univ., AL, USAV.D. Agrawal, Dept. of Electr. & Comput. Eng., Auburn Univ., AL, USA