FPGA Trust Zone: Incorporating trust and reliability into FPGA designs

Vinayaka Jyothi; Manasa Thoonoli; Richard Stern; Ramesh Karri

doi:10.1109/ICCD.2016.7753346

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2016 IEEE 34th International Conference on Computer Design (ICCD)

FPGA Trust Zone: Incorporating trust and reliability into FPGA designs

Year: 2016, Pages: 600-605

DOI Bookmark: 10.1109/ICCD.2016.7753346

Authors

Vinayaka Jyothi, ECE Department, NYU Tandon School of Engineering, Brooklyn, New York, USA
Manasa Thoonoli, ECE Department, NYU Tandon School of Engineering, Brooklyn, New York, USA
Richard Stern, Cubic Defense Applications, San Diego, California, USA
Ramesh Karri, ECE Department, NYU Tandon School of Engineering, Brooklyn, New York, USA

FPGA Trust Zone: Incorporating trust and reliability into FPGA designs

Authors

Abstract