2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW)
Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging
DOI Bookmark: 10.1109/ICCVW60793.2023.00062
Authors
Astrid Tempelaere, KU Leuven,BelgiumLeen Van Doorselaer, KU Leuven,Belgium
Jiaqi He, KU Leuven,Belgium
Pieter Verboven, KU Leuven,Belgium
Tinne Tuytelaars, KU Leuven,Belgium
Bart Nicolai, KU Leuven,Belgium