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Proceedings
ICPR
ICPR 2000

Pattern Recognition, International Conference on

Reduction of Bias in Maximum Likelihood Ellipse Fitting

Year: 2000, Volume: 3, Pages: 3802

DOI Bookmark: 10.1109/ICPR.2000.903664

Authors

Bogdan Matei, Rutgers University
Peter Meer, Rutgers University

Abstract

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