An Analysis of Machine Learning Algorithms for Condensing Reverse Engineered Class Diagrams

Mohd Hafeez Osman; Michel R. V. Chaudron; Peter Van Der Putten

doi:10.1109/ICSM.2013.25

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2013 IEEE International Conference on Software Maintenance (ICSM)

An Analysis of Machine Learning Algorithms for Condensing Reverse Engineered Class Diagrams

Year: 2013, Pages: 140-149

DOI Bookmark: 10.1109/ICSM.2013.25

Authors

Mohd Hafeez Osman, Leiden Inst. of Adv. Comput. Sci., Leiden Univ., Leiden, Netherlands
Michel R. V. Chaudron, Leiden Inst. of Adv. Comput. Sci., Leiden Univ., Leiden, Netherlands
Peter Van Der Putten, Leiden Inst. of Adv. Comput. Sci., Leiden Univ., Leiden, Netherlands

An Analysis of Machine Learning Algorithms for Condensing Reverse Engineered Class Diagrams

Authors

Abstract