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2024 IEEE International Conference on Software Maintenance and Evolution (ICSME)

Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching

Year: 2024, Pages: 741-752

DOI Bookmark: 10.1109/ICSME58944.2024.00078

Authors

Gabin An, KAIST,Daejeon,Korea
Juyeon Yoon, KAIST,Daejeon,Korea
Thomas Bach, SAP,Waldorf,Germany
Jingun Hong, SAP Labs Korea,Seoul,Korea
Shin Yoo, KAIST,Daejeon,Korea

Abstract