Coverage-Driven Test Generation for Thread-Safe Classes via Parallel and Conflict Dependencies

Valerio Terragni; Mauro Pezzè; Francesco Adalberto Bianchi

doi:10.1109/ICST.2019.00034

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2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)

Coverage-Driven Test Generation for Thread-Safe Classes via Parallel and Conflict Dependencies

Year: 2019, Pages: 264-275

DOI Bookmark: 10.1109/ICST.2019.00034

Authors

Valerio Terragni, USI Università della Svizzera italiana
Mauro Pezzè, USI Università della Svizzera italiana, Università degli Studi di Milano-Bicocca
Francesco Adalberto Bianchi, USI Università della Svizzera italiana

Coverage-Driven Test Generation for Thread-Safe Classes via Parallel and Conflict Dependencies

Authors

Abstract