2016 IEEE International Symposium on Workload Characterization (IISWC)
Resilience characterization of a vision analytics application under varying degrees of approximation
DOI Bookmark: 10.1109/IISWC.2016.7581283
Authors
Radha Venkatagiri, University of Illinois at Urbana-ChampaignKarthik Swaminathan, IBM Research
Chung-ching Lin, IBM Research
Liang Wang, University of Virginia
Alper Buyuktosunoglu, IBM Research
Pradip Bose, IBM Research
Sarita Adve, University of Illinois at Urbana-Champaign