Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

Milos Stanisavljevic; Alexandre Schmid; Yusuf Leblebici

doi:10.1109/DFT.2009.54

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

Year: 2009, Pages: 340-348

DOI Bookmark: 10.1109/DFT.2009.54

Authors

Milos Stanisavljevic
Alexandre Schmid
Yusuf Leblebici

Abstract

Note that for IPDPS 2010, the conference proceedings will be published by the IEEE Digital Library under two separate ISBN's, one for regular conference papers and the other for the workshops papers and the PhD Forum short papers. This will not change the format of the program from previous years; this single CD-ROM of proceedings distributed at the conference contains the two separate volumes of papers.

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Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

Authors

Abstract

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