2013 IEEE Symposium on Computers and Communications (ISCC)
Probability of error and ergodic capacity of switch-and-examine combining diversity over the α-μ fading channel
DOI Bookmark: 10.1109/ISCC.2013.6755027
Authors
Refaat Mohamed, Department of Electronics and Communications Engineering, Faculty of Engineering, Cairo University, Giza 12613, EgyptMahmoud H. Ismail, Department of Electronics and Communications Engineering, Faculty of Engineering, Cairo University, Giza 12613, Egypt
Fatma A. Newagy, Department of Electronics and Communications Engineering, Faculty of Engineering, Ain Shams University, Cairo, Egypt
Hebat-Allah M. Mourad, Department of Electronics and Communications Engineering, Faculty of Engineering, Cairo University, Giza 12613, Egypt