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Proceedings
ISCTECH
ISCTECH 2022

2022 10th International Conference on Information Systems and Computing Technology (ISCTech)

Hub Defect Monitoring and Enhancement System Based on Image Recognition

Year: 2022, Pages: 798-804

DOI Bookmark: 10.1109/ISCTech58360.2022.00131

Authors

Tianci Wang, Wuhan University-of Technology,Wuhan,China

Abstract

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