Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits

Mostafa Abd-El-Barr; Maher Al-Sherif; Mohamed Osman

doi:10.1109/ISMVL.1999.779726

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Proceedings 1999 29th IEEE International Symposium on Multiple-Valued Logic (Cat. No.99CB36329)

Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits

Year: 1999, Pages: 262

DOI Bookmark: 10.1109/ISMVL.1999.779726

Authors

Mostafa Abd-El-Barr, King Fahd University of Petroleum and Minerals
Maher Al-Sherif, King Fahd University of Petroleum and Minerals
Mohamed Osman, King Fahd University of Petroleum and Minerals

Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits

Authors

Abstract